NIE-NPVS
Design and Programming of Embedded Systems
topics are valid since SFE in February 2025
| Label | Topic | Course |
|---|---|---|
| NIE-NPVS-1 | Hardware and software implementation of operations over finite fields GF(p) and GF(2^m). Addition, multiplication, inversion, squaring. | NIE-BVS |
| NIE-NPVS-2 | Methods of implementation of exponentiation. Efficient implementation of RSA. | NIE-BVS |
| NIE-NPVS-3 | Brute-force attack. Attacks using TMTO (time-memory trade-off) tables. Side channel attacks. | NIE-BVS |
| NIE-NPVS-4 | Correction or multiple error detection codes, BCH and RS codes, product of codes, and extended codes. | NIE-BKO |
| NIE-NPVS-5 | Codes for correcting or detecting bursts of errors, especially interleaved codes and Meggitt’s decoder. | NIE-BKO |
| NIE-NPVS-6 | Timing in synchronous systems, clock domains, clock domain crossing. | NIE-EHW |
| NIE-NPVS-7 | Resources in programmable devices, their use. | NIE-EHW |
| NIE-NPVS-8 | Electronic System Level, models used in that level of abstraction. | NIE-EHW |
| NIE-NPVS-9 | Basic concepts and simulation principles, characteristics of levels of abstraction (logic level, RTL, TLM). Basic concepts of transactions. | NIE-SIM |
| NIE-NPVS-10 | Verilog simulation language: characteristics of sequential and parallel environments, use of variables and nets, delays and assignment types, resolution functions, process synchronization, non-deterministic behavior. | NIE-SIM |
| NIE-NPVS-11 | Functional verification: basic concepts, structure of the verification environment, use of transactions, features of the SystemVerilog language and the UVM library used to design verification programs. | NIE-SIM |
| NIE-NPVS-12 | Embedded software development: specifics, reliable software development, debugging and testing. Optimization at the source code, compiler, and linker level. Impact of optimization on embedded software functionality. Code optimization for low power consumption. | NIE-ESW |
| NIE-NPVS-13 | Digital signal processing, fast Fourier transform, Z-transform, Z-transform of simple signals, finite and infinite impulse response filters, first and second derivative filters, filter transfer function, impulse response, and filter implementation on different platforms. | NIE-ESW |
| NIE-NPVS-14 | Artificial intelligence in embedded systems, basic concepts: artificial neurons, activation functions, gradient learning. Deep neural networks, layers, implementation frameworks, and platforms. Synthesis of neural networks into programmable hardware. | NIE-ESW |
| NIE-NPVS-15 | Signals, systems, and their properties, automata as representations of systems, continuous and discrete systems | NIE-TES |
| NIE-NPVS-16 | Composition of systems and automata, synchronous reactive models | NIE-TES |
| NIE-NPVS-17 | Classification of system verification methods (testing, bounded model checking, unbounded model checking). | NIE-TES |
| NIE-NPVS-18 | Boolean satisfiability: algorithms and their usage in bounded model checking | NIE-TES |
| NIE-NPVS-19 | Automatic Test Patterns Generation (ATPG) algorithms for combinational and sequential circuits. Fault simulation, test compaction. Test compression. | NIE-TSP |
| NIE-NPVS-20 | Design for Testability (DFT). Scan-chain. Built-in Self-Test mechanisms, pseudo-random testing, test response analysis. | NIE-TSP |
| NIE-NPVS-21 | Reliability parameters, their meaning, calculation. Improving the reliability, fault-tolerant systems. On-line testing. Reliability Block Diagrams (RBDs), Fault Trees, Markov models. Reliability standards. | NIE-TSP |
📄 The table is available also in CSV (semicolon-separated values). 🔙 History of changes is on GitLab.